Surface modification of silicon (100) surfaces, and characterization using sum frequency generation spectroscopy (SFG), x-ray photoelectron spectroscopy (XPS), and contact angle goniometry.

Presenter Information

Simeon Sunday

Author ORCID

0000-0003-4218-8673

Abstract

Elucidating the fundamental principles of the surface chemistry of silicon (100) modified surfaces is vital because of its widespread application in semiconductor technology.

Status

Graduate

Department

Chemistry & Biochemistry

College

College of Arts and Sciences

Campus

Athens

Faculty Mentor

Dr. Katherine Cimatu

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Surface modification of silicon (100) surfaces, and characterization using sum frequency generation spectroscopy (SFG), x-ray photoelectron spectroscopy (XPS), and contact angle goniometry.

Elucidating the fundamental principles of the surface chemistry of silicon (100) modified surfaces is vital because of its widespread application in semiconductor technology.